MWR-SIM Lifetime determination is based on measuring photoconductivity decay after pulselight photo-exciting with usage of reflected microwave as probe.It enables repetition and contactless of measurement and does not require specialsurface treatment before measurement or wafer cutting.

Product's Feature：

■ Non-contact and non-invasive measurement
■ Portable measure head
■ Materials: Si, Ge
■ Application:
■Material quality control
■Incoming ingot & wafer inspection
■Heavy metal contamination detection inprocessed wafers

Technique Specification：

Typical Customer:
American,Europe and Asia and so on.