- ? Instrument
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- ? Instrument for Silicon Material
- ? Instrument for CZ&DSS
- ? Instrument for Wafer
- ? Instrument for Solar Cell
- ? Instrument for Module
- ? Instrument for PV Station
- ? LED instrument
- ? Other instrument
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- ? Software
- ? Process software
- ? System software
- ? Application Software
- ? Intrument exchange
- ? Overview
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- ? Exchange notice
- ? Exchange Center
- ? Maintenance Service
- ? PV Equipment Upgrades
- ? Auxiliary Equipment Maintenance
Product introduction:
SQM-500 Surface quality Measurement system is used for the surface cleanness testing and analyze of sample.
SQM provide a quantitative analysis of the cleanness of the surface, which was the first announced by us. The system can be used to non-contract detect the contamination of the surface and provide an accurate result immediately. The result can provide a powerful and real data for analyze, which is the insurance for the quality.
Product features:
■ all kinds of surfaces: si, Sapphire/SIC/
■ kinds of contaminations: organic or metal
■ provide a quantitative analysis of cleanness
■ can provide a degree of cleanness
■ measurement the thickness of the thin film
■ non-contract and non damage
■ online and offline(options)
■ the accuracy can be 10nm
Customer:
Honeywell; IBM; Alcan; 3M; A.O. Smith; AMT; Allied Signal; Alcon laboratories; AT&T; BMI; Boeing; Dupont; ESCA; Energy Conversion Devices; Faith Tool & Die Co.; Fel-Pro; FMC; H.C. STARCK; Holonix; KOMAG; Materials Research Corp.; Micro Switch; SONY
